In standard XAFS data reduction there is often a spurious peak at low-
r in the Fourier transform of the k-space data, which we attribute to
features in the X-ray absorption spectrum that are not related to the
backscattering of the photoelectron from the neighboring atoms. These
features have been observed in the k-space range up to 6 Angstrom(-1),
and can therefore interfere with the analysis of the XAFS oscillation
s. We have developed an iterative method to extract the background. Fi
rst we use a spline to obtain a rough estimate of the background and f
it the XAFS data to a sum of standards in r-space. The resulting fit i
s then subtracted from the raw data; the subtraction-corrected functio
n is smoothed to extract a better background, which is used to re-redu
ce the raw data. This process converges after only a few iterations. S
ome examples of the extracted background structure are presented, and
the ramifications for XAFS analysis are discussed.