DEPTH SELECTIVE CHEMICAL-STATE ANALYSIS OF FLY-ASH WITH SIMULTANEOUS XANES MEASUREMENT OF TOTAL ELECTRON AND X-RAY-FLUORESCENCE YIELDS

Authors
KAWAI J HAYAKAWA S ZHENG SY KITAJIMA Y ADACHI H GOHSHI Y ESAKA F FURUYA K
Citation
J. Kawai et al., DEPTH SELECTIVE CHEMICAL-STATE ANALYSIS OF FLY-ASH WITH SIMULTANEOUS XANES MEASUREMENT OF TOTAL ELECTRON AND X-RAY-FLUORESCENCE YIELDS, Physica. B, Condensed matter, 209(1-4), 1995, pp. 237-238
Citations number
6
Categorie Soggetti
Physics, Condensed Matter
Journal title
Physica. B, Condensed matter → ACNP
ISSN journal
09214526
Volume
209
Issue
1-4
Year of publication
1995
Pages
237 - 238
Database
ISI
SICI code
0921-4526(1995)209:1-4<237:DSCAOF>2.0.ZU;2-P
Abstract
We have developed a method to obtain both surface (< 100 Angstrom) and bulk chemical state of powder samples simultaneously. This method is applied to analyze depth profile of fly ash samples and find that the chemical state of surface sulfur is different from that of bulk sulfur .