A technique of amplitude normalization for fluorescence detection surf
ace XAS experiments is described. Fluorescence yield as a function of
energy is normalized using a model for the electric field standing wav
e. Model parameters are fixed by variational optimization of the measu
red specular reflectivity. This method is applied to an in situ measur
ement of a nominal monolayer of Cu atoms underpotentially deposited on
to polycrystalline Pt.