LOCAL-STRUCTURE DETERMINATION FOR SURFACE CHLORINATION WITH EELFS

Authors
ANDRYUSHECHKIN BV ELTSOV KN SHEVLYUGA VM
Citation
Bv. Andryushechkin et al., LOCAL-STRUCTURE DETERMINATION FOR SURFACE CHLORINATION WITH EELFS, Physica. B, Condensed matter, 209(1-4), 1995, pp. 471-473
Citations number
9
Categorie Soggetti
Physics, Condensed Matter
Journal title
Physica. B, Condensed matter → ACNP
ISSN journal
09214526
Volume
209
Issue
1-4
Year of publication
1995
Pages
471 - 473
Database
ISI
SICI code
0921-4526(1995)209:1-4<471:LDFSCW>2.0.ZU;2-W
Abstract
In this paper the results of an investigation of the local structure o f a layer of molecular chlorine condensed on Si(100) at T = 110 K and an unbroken AgCl film evaporated on Ag(111) at T = 160 K are presented . It was found that the nearest neighbor Cl-Ag distance in the AgCl fi lm of 2.75 +/- 0.05 Angstrom is in good agreement with bulk values (2. 77 Angstrom). The Cl-Cl distance of 2.00 +/- 0.05 Angstrom in a chlori ne film condensed on Si(100) is also close to the bulk value (1.98 Ang strom).