MASS-SPECTROMETRY - THE IMPORTANT CHARACTERIZATION METHOD OF FULLERENES

Citation
L. Dunsch et al., MASS-SPECTROMETRY - THE IMPORTANT CHARACTERIZATION METHOD OF FULLERENES, Journal of molecular structure, 348, 1995, pp. 381-384
Citations number
10
Categorie Soggetti
Chemistry Physical
ISSN journal
00222860
Volume
348
Year of publication
1995
Pages
381 - 384
Database
ISI
SICI code
0022-2860(1995)348:<381:M-TICM>2.0.ZU;2-M
Abstract
A sector field mass spectrometer was applied to generate fullerene ion s with different ionisation methods. Electron impact ionisation (EI), chemical ionisation (CI), fast atom bombardment ionisation (FAB) and f ield desorption/field ionisation (FD/FI) were used for the generation of ions. The yield of ions, the molecule fragmentation, multiple ionis ation and the detection efficiency of higher and endohedral fullerenes are compared. It was found that the negative ion CI is the best ionis ation method for fullerenes. Examples of metallofullerene mass spectra are shown and problems during the recording are discussed.