MEASUREMENT AND ANALYSIS OF THE ELECTRIC-FIELD IN SEMICONDUCTOR-LASERS BY CONTINUOUS-WAVE ELECTROOPTIC PROBING

Authors
WANG S ZHU ZH
Citation
S. Wang et Zh. Zhu, MEASUREMENT AND ANALYSIS OF THE ELECTRIC-FIELD IN SEMICONDUCTOR-LASERS BY CONTINUOUS-WAVE ELECTROOPTIC PROBING, Applied physics A: Materials science & processing, 60(4), 1995, pp. 425-429
Citations number
3
Categorie Soggetti
Physics, Applied
Journal title
Applied physics A: Materials science & processing → ACNP
ISSN journal
09478396
Volume
60
Issue
4
Year of publication
1995
Pages
425 - 429
Database
ISI
SICI code
0947-8396(1995)60:4<425:MAAOTE>2.0.ZU;2-T
Abstract
The electric field distribution in semiconductor lasers are detected e xperimentally by using CWEOP (Continuous-Wave Electro-Optic Probing). The paper briefly describes the experimental results. The obtained res ults reflect several characteristics of the lasers such as injection c urrent, carrier confinement, and the variation of the distribution of the electric field corresponding to different bias conditions.