Re. Russo et al., LASER-ABLATION SAMPLING WITH INDUCTIVELY-COUPLED PLASMA-ATOMIC EMISSION-SPECTROMETRY FOR THE ANALYSIS OF PROTOTYPICAL GLASSES, Journal of analytical atomic spectrometry, 10(4), 1995, pp. 295-301
Laser ablation sampling is Presented as an alternative to dissolution
procedures for elemental analyses of prototypical glasses using induct
ively coupled plasma atomic emission spectrometry. These glass samples
were prototypes of vitrified waste products from the Savannah River T
echnology Center. The samples were not translated or rotated during la
ser sampling, but were repetitively sampled at a single spot using a K
rF excimer laser with a 10 Hz repetition rate. The time-dependent mass
ablation rate was measured and is discussed. Silicon, the major eleme
nt in the matrix, was used as an internal standard, and excellent prec
ision (s(r) = 1-3%) was obtained. Quantitative analysis was demonstrat
ed using known prototypical glass compositions.; Preferential vaporiza
tion was investigated by comparing measured elemental ratios using a n
anosecond excimer laser (lambda = 248 nm) and a picosecond Nd:YAG lase
r (fourth harmonic, lambda = 266 nm).