SCANNING ANALYTICAL MICROSCOPY OF MULTILA YER SEMICONDUCTOR HETEROSTRUCTURES

Citation
Sf. Dunaev et al., SCANNING ANALYTICAL MICROSCOPY OF MULTILA YER SEMICONDUCTOR HETEROSTRUCTURES, Izvestia Akademii nauk SSSR. Seria fiziceskaa, 59(2), 1995, pp. 2-7
Citations number
9
Categorie Soggetti
Physics
ISSN journal
03676765
Volume
59
Issue
2
Year of publication
1995
Pages
2 - 7
Database
ISI
SICI code
0367-6765(1995)59:2<2:SAMOMY>2.0.ZU;2-W