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ITA
ENG
SCANNING ANALYTICAL MICROSCOPY OF MULTILA YER SEMICONDUCTOR HETEROSTRUCTURES
Authors
DUNAEV SF
EGORENKOV OA
FILIPPOV MN
Citation
Sf. Dunaev et al., SCANNING ANALYTICAL MICROSCOPY OF MULTILA YER SEMICONDUCTOR HETEROSTRUCTURES, Izvestia Akademii nauk SSSR. Seria fiziceskaa, 59(2), 1995, pp. 2-7
Citations number
9
Categorie Soggetti
Physics
Journal title
Izvestia Akademii nauk SSSR. Seria fiziceskaa
→
ACNP
ISSN journal
03676765
Volume
59
Issue
2
Year of publication
1995
Pages
2 - 7
Database
ISI
SICI code
0367-6765(1995)59:2<2:SAMOMY>2.0.ZU;2-W