THE TECHNIQUE OF STANDARD PREPARATION FOR TEM, SEM AND MICRO-PROBE ANALYSIS

Citation
Mi. Lapina et Av. Mokhov, THE TECHNIQUE OF STANDARD PREPARATION FOR TEM, SEM AND MICRO-PROBE ANALYSIS, Izvestia Akademii nauk SSSR. Seria fiziceskaa, 59(2), 1995, pp. 38-41
Citations number
4
Categorie Soggetti
Physics
ISSN journal
03676765
Volume
59
Issue
2
Year of publication
1995
Pages
38 - 41
Database
ISI
SICI code
0367-6765(1995)59:2<38:TTOSPF>2.0.ZU;2-1