XPS INVESTIGATION OF THE SURFACE-COMPOSITION OF SPUTTERED YBCO THIN-FILMS

Authors
BEYER J SCHURIG T MENKEL S QUAN Z KOCH H
Citation
J. Beyer et al., XPS INVESTIGATION OF THE SURFACE-COMPOSITION OF SPUTTERED YBCO THIN-FILMS, Physica. C, Superconductivity, 246(1-2), 1995, pp. 156-162
Citations number
16
Categorie Soggetti
Physics, Applied
Journal title
Physica. C, Superconductivity → ACNP
ISSN journal
09214534
Volume
246
Issue
1-2
Year of publication
1995
Pages
156 - 162
Database
ISI
SICI code
0921-4534(1995)246:1-2<156:XIOTSO>2.0.ZU;2-3
Abstract
Post-growth in-situ XPS spectra of c-axis oriented YBCO thin films dep osited by hollow cathode discharge sputtering on (100) MgO and (001) Y SZ buffered r-plane sapphire have been measured. The XPS data have bee n quantitatively analyzed and show evidence of a BaO/CuO2/Y/CuO2/BaO/C uO/BaO layer sequence on the surface of the films grown on MgO substra tes. The behavior of the XPS spectra of Ba in the case of YBCO on YSZ/ sapphire is qualitatively different from that of YBCO on MgO.