CRYSTALLOGRAPHIC PROPERTIES OF LA-MODIFIED AND MG-MODIFIED PBTIO3 THIN-FILMS PREPARED BY RF-MAGNETRON SPUTTERING METHOD

Citation
M. Kobune et al., CRYSTALLOGRAPHIC PROPERTIES OF LA-MODIFIED AND MG-MODIFIED PBTIO3 THIN-FILMS PREPARED BY RF-MAGNETRON SPUTTERING METHOD, Nippon Seramikkusu Kyokai gakujutsu ronbunshi, 103(3), 1995, pp. 298-301
Citations number
10
Categorie Soggetti
Material Science, Ceramics
ISSN journal
09145400
Volume
103
Issue
3
Year of publication
1995
Pages
298 - 301
Database
ISI
SICI code
0914-5400(1995)103:3<298:CPOLAM>2.0.ZU;2-T
Abstract
Highly c-axis-oriented lanthanum- and magnesium-modified PbTiO3 thin f ilms with compositions of {(1-x) Pb0.9La0.1Ti0.975O3 + xMgO}, where x= 0-0.025 (PLMT), were prepared on (100)-oriented Pt film electrodes/ (1 00)MgO single-crystal substrate by rf-magnetron sputtering method. The c-axis orientation, crystallinity, and structure of surface and cross section of films obtained were investigated in detail. From the viewp oint of the crystallographic properties, PLMT films with compositions of x=0.005-0.010 show great promise as new element thin-film materials .