FEASIBILITY OF REFLECTION ELECTRON-ENERGY-LOSS SPECTROSCOPY WITH A SMALL SCATTERING ANGLE FOR RESEARCH IN SURFACE SCIENCE

A reflection electron energy loss spectroscopy (R-EELS) system has bee n developed to investigate local surface atomic structures around ligh t atoms such as C, N, and O. In this system, the primary electrons are incident on a surface at a grazing angle, and the electrons scattered inelastically at a small scattering angle are energy-analyzed to make the momentum transfer from the primary electrons to the scattered one s as small as possible. With this system, one can measure an energy lo ss near edge structure (ELNES) and an extended energy loss line struct ure (EXELFS), compared with an X-ray absorption near edge structure (X ANES) and an extended X-ray absorption fine structure (EXAFS). The fea sibility of the system in surface science is examined by measurements of ELNES and EXELFS for oxygen-adsorbed Ni(100) surfaces.