EFFECTS OF SEEDING LAYER ON ORIENTATION AND PHASE-FORMATION OF SOL-GEL-DERIVED LANTHANUM-MODIFIED LEAD-ZIRCONATE-TITANATE FILMS ON GLASS

Sol-gel-derived lanthanum-modified lead zirconate titanate (PLZT) thin films with La/Zr/Ti ratios of 9.5/65/35, 15.5/40/60 and 18/30/70 were prepared on Coming 7059 glass substrates using a seeding layer [PLZT( 14/0/100)]. The X-ray diffraction patterns and the microstructures of the films were investigated. The PLZT(9.5/65/35) thin films without th e seeding layer consisted of both pyrochlore and amorphous phases. How ever the PLZT(9.5/65/35) thin films with the seeding layer showed pref erred orientation as well as higher perovskite phase content. The orie ntation of the film varied with the thickness and the heat treatment o f the seeding layer. The results will be discussed in terms of the eff ects of the seeding layer on the orientation and the content of the pe rovskite phase of the PLZT thin films on glass substrates.