Am. Wrobel et al., PLASMA CHEMICAL-VAPOR-DEPOSITION OF A-C-S-N-H FILMS USING ORGANOISOTHIOCYANATES AS NOVEL SINGLE-SOURCE PRECURSORS, Thin solid films, 289(1-2), 1996, pp. 112-120
Amorphous C:S:N:H thin-film materials were produced from methyl, propy
l-, allyl-, and phenyl isothiocyanate source compounds in plasma chemi
cal vapor deposition (PCVD). The PCVD process was investigated in term
s of the deposition yield and pressure increase in the reactor. These
parameters provide insight into the mechanism of plasma activation of
the organoisothiocyanates. The films are characterized in terms of the
ir structure, elemental composition, optical absorption and electrical
conductivity. The ultraviolet-visible (UV-VIS) spectral data account
for the presence of two optical gaps in the examined materials. The li
ght absorption is related to the excitation of electrons with a contri
bution by the localized states of molecular nature, which contain pi-b
onds. The materials, owing to their rather low conductivities (not exc
eeding 10(-11) S m(-1)), can be classified as dielectrics. The thermal
treatment of the films in nitrogen was found to increase the conducti
vity by three orders of magnitude. The films reveal a substantial phot
oconductivity effect which appears to be sensitive to the light wavele
ngth. The evaluated quantum yield values are 10(-5)-10(-4) el. quant(-
1).