BURIED-CHANNEL WNX W SELF-ALIGNED GAAS-MESFET PROCESS WITH SELECTIVELY IMPLANTED CHANNEL AND UNDOPED EPITAXIAL SURFACE-LAYERS FOR MMIC APPLICATIONS/

Citation
K. Nishihori et al., BURIED-CHANNEL WNX W SELF-ALIGNED GAAS-MESFET PROCESS WITH SELECTIVELY IMPLANTED CHANNEL AND UNDOPED EPITAXIAL SURFACE-LAYERS FOR MMIC APPLICATIONS/, JPN J A P 1, 34(2B), 1995, pp. 1241-1245
Citations number
6
Categorie Soggetti
Physics, Applied
Volume
34
Issue
2B
Year of publication
1995
Pages
1241 - 1245
Database
ISI
SICI code
Abstract
The combined process of epitaxy and ion implantation has been develope d in the fabrication of a buried-channel WNx/W self-aligned GaAs metal -semiconductor field-effect transistor (MESFET). This MESFET comprises an ion-implanted channel and an undoped GaAs epitaxial surface layer. The ion-implantation technique leads to an IC-oriented process and th e epitaxial technique to a buried channel structure. Both ease of isol ation and enhanced breakdown voltage were attained, promising monolith ic microwave integrated circuits (MMICs) for L-band digital mobile com munication systems.