X-RAY-DIFFRACTION STUDY OF ND2CUO4 SINGLE-CRYSTALS AT 20 K

Citation
Ip. Makarova et al., X-RAY-DIFFRACTION STUDY OF ND2CUO4 SINGLE-CRYSTALS AT 20 K, Acta crystallographica. Section B, Structural science, 52, 1996, pp. 93-99
Citations number
30
Categorie Soggetti
Crystallography
ISSN journal
01087681
Volume
52
Year of publication
1996
Part
1
Pages
93 - 99
Database
ISI
SICI code
0108-7681(1996)52:<93:XSONSA>2.0.ZU;2-L
Abstract
Single crystals of Nd2CuO4, a parent compound for the electron-doped h igh-T-c superconductors, have been studied using X-ray diffraction dat a collected at 20 K. Structure refinements indicated that the specimen was nonstoichiometric, with the approximate formula Nd1.89CuO3.85. Di fference Fourier maps showed significant residual peaks around the Cu and Nd atoms. The residual density around the Cu atom had features cha racteristic of the valence state +2. Part of the nonspherical effects observed around the Nd atom could be described using the Gram-Charlier series expansion of the Gaussian density function, indicating either static or dynamic displacements of this atom, while part of the residu al density was attributed to bonding effects. The bonding of the O(1) atom, located in the plane of the Cu atoms, was found to be different from the bonding of the O(2) atom, situated between the Cu-O(1) layers .