MICROSTRUCTURE AND MAGNETOELASTIC COUPLING-COEFFICIENTS IN THIN NIFE AND NI FILMS

Citation
Os. Song et al., MICROSTRUCTURE AND MAGNETOELASTIC COUPLING-COEFFICIENTS IN THIN NIFE AND NI FILMS, Journal of applied physics, 79(6), 1996, pp. 3141-3144
Citations number
18
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
79
Issue
6
Year of publication
1996
Pages
3141 - 3144
Database
ISI
SICI code
0021-8979(1996)79:6<3141:MAMCIT>2.0.ZU;2-M
Abstract
The effective magnetoelastic (ME) coupling coefficients B-eff of polyc rystalline Ni79Fe21 and Ni films have been reported as functions of th ickness t. B-eff was observed to have a thickness-independent bulk ter m, B-b, and a thickness-dependent surface term, B-s/t consistent with the Neel model. For thickness below 50 Angstrom the surface term is im portant; it can change the sign of the effective ME coupling constant and dramatically increase its magnitude. We expect that the surface ME coupling we observe in polycrystalline thin films may be a combinatio n of the intrinsic Neel surface effect and extrinsic microstructure ef fects. Our transmission electron microscopy, Auger depth profiling, an d atomic force microscopy rule out film discontinuity and compositiona l gradients as significant sources of he surface ME effect. (C) 1996 A merican Institute of Physics.