Mn. Satyanarayan et al., EFFECT OF THERMAL ANNEALING ON THE DIELECTRIC-PROPERTIES OF KTIOPO4 SINGLE-CRYSTALS, Journal of applied physics, 79(6), 1996, pp. 3241-3245
Dielectric properties of potassium titanyl phosphate have been investi
gated as a function of thickness and frequency, as well as annealing t
reatment under various atmospheres. The low frequency dielectric const
ant of KTP crystals is shown to depend upon the sample thickness, and
this feature is attributed to the existence of surface layers. The fre
quency-dependent dielectric response of KTP exhibits a non-Debye type
relaxation, with a distribution of relaxation times. The dielectric be
havior of KTP samples annealed in various atmospheres shows that the l
ow frequency dielectric constant is influenced by the contribution fro
m the space charge layers. Prolonged annealing of the samples leads to
a surface degradation, resulting in the formation of a surface layer
of lower dielectric constant. This surface degradation is least when a
nnealed in the presence of dry oxygen. From the analysis of the dielec
tric data using complex electric modulus, alpha(m) has been evaluated
for the virgin and annealed samples. (C) 1996 American Institute of Ph
ysics.