CHARACTERIZATION OF NANOSTRUCTURED MATERIALS BY MOSSBAUER SPECTROMETRY

Citation
G. Lecaer et P. Delcroix, CHARACTERIZATION OF NANOSTRUCTURED MATERIALS BY MOSSBAUER SPECTROMETRY, Nanostructured materials, 7(1-2), 1996, pp. 127-135
Citations number
42
Categorie Soggetti
Material Science
Journal title
ISSN journal
09659773
Volume
7
Issue
1-2
Year of publication
1996
Pages
127 - 135
Database
ISI
SICI code
0965-9773(1996)7:1-2<127:CONMBM>2.0.ZU;2-6
Abstract
Some recent contributions of Mossbauer spectrometry to the characteriz ation of nanostructured materials are described. The statistically mea ningful information conveyed by Mossbauer spectra and the atomic scale sensitivity of the method are invaluable for studying problems specif ic to the nanometer range which are often difficult to investigate wit h more conventional techniques. Phenomena that occur during the synthe sis of nanomaterials by ball milling, studies of grain boundaries, inv estigation of thermal stability of bulk materials are discussed.