XPS STUDY OF PHOTOREFRACTIVE SR0.61BA0.39NB2O6-CE CRYSTALS

Authors
NIEMANN R BUSE K PANKRATH R NEUMANN M
Citation
R. Niemann et al., XPS STUDY OF PHOTOREFRACTIVE SR0.61BA0.39NB2O6-CE CRYSTALS, Solid state communications, 98(3), 1996, pp. 209-213
Citations number
21
Categorie Soggetti
Physics, Condensed Matter
Journal title
Solid state communications → ACNP
ISSN journal
00381098
Volume
98
Issue
3
Year of publication
1996
Pages
209 - 213
Database
ISI
SICI code
0038-1098(1996)98:3<209:XSOPSC>2.0.ZU;2-N
Abstract
X-ray photoelectron spectroscopy (XPS) measurements show that Ce occur s in photorefractive Sr0.61Ba0.39Nb2O6 (SBN) crystals mainly in the va lence state 3+. We give arguments that Ce-3+/4+ is the photorefractive center in SBN:Ce with a typical concentration ratio c(Ce?(3+))/c(Ce?( 4+)) = 600. Quantitative analysis of the XPS data yields a Ce distribu tion coefficient of about 0.6 +/- 0.3.