ELECTROSTATIC PROPERTIES IN ZEOLITE-TYPE MATERIALS FROM HIGH-RESOLUTION X-RAY-DIFFRACTION - THE CASE OF NATROLITE

Citation
Ne. Ghermani et al., ELECTROSTATIC PROPERTIES IN ZEOLITE-TYPE MATERIALS FROM HIGH-RESOLUTION X-RAY-DIFFRACTION - THE CASE OF NATROLITE, Physical review. B, Condensed matter, 53(9), 1996, pp. 5231-5239
Citations number
41
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
53
Issue
9
Year of publication
1996
Pages
5231 - 5239
Database
ISI
SICI code
0163-1829(1996)53:9<5231:EPIZMF>2.0.ZU;2-2
Abstract
High-resolution x-ray-diffraction data of natrolite at room temperatur e give by multipolar refinement an analytical expression of the electr on density which permits the calculation of net atomic charges and ele ctrostatic potential. The observed net charges show that the structura l formula of natrolite may be written Na2Al2Si2O8(SiO2),2H(2)O. The el ectrostatic energy of one sodium ion inside the crystal is estimated t o -21.6 eV. Calculation of the electrostatic potential excluding one s odium shows that the minimum is precisely at the removed Na position.