THE INFLUENCE OF THE SURFACE BINDING-ENERGY ON THE EMISSION OF MCS(-ION MASS-SPECTROMETRY() SECONDARY IONS FROM ELEMENTAL TARGETS IN SECONDARY)

Energy distributions of MCs(+) ions, emitted from several elemental (Z n, Ge, Cu, Ni, Mo) targets using Cs+ ion bombardment, were measured. A comparison with the theoretical energy distribution of sputtered neut ral atoms M reveals that the MCs(+) distribution and the M distributio n depend in the same way on the elements' surface binding energy U-0, Increasing U-0 leads to a broader distribution, characterized by highe r mean emission energy. Furthermore, the MCs(+) mass signal increases with a decrease in mean emission energy. This provides evidence for th e correlated emission of the two partners forming the MCs(+) molecule.