L. Wartski et al., RADIO-FREQUENCY, MICROWAVE, AND ELECTRON-CYCLOTRON-RESONANCE ION SOURCES FOR INDUSTRIAL APPLICATIONS - A REVIEW, Review of scientific instruments, 67(3), 1996, pp. 895-900
We recall the different classes of electromagnetic field excited ion s
ources and their characteristic features in the scope of industrial ap
plications. Emphasis is laid on various criteria and conditions: long
source lifetimes, intense inert or reactive ion beams free from contam
inants, low process pressures, severe environmental conditions, reliab
ility, possibility of automatic control, simplicity in handling, and m
aintenance. Examples of sources particularly suited to processes invol
ving deposition or surface modification of materials are reviewed. Spe
cific technological solutions and designs applied to these sources for
industrial applications are examined. A few examples of applications
using ion-beam processes in different fields (optics, microelectronics
, and mechanics) are presented and further trends, especially for inli
ne surface treatments, are examined. (C) 1996 American Institute of Ph
ysics.