ION SOURCES FOR IMPLANTATION APPLICATION

Citation
K. Matsuda et M. Tanjyo, ION SOURCES FOR IMPLANTATION APPLICATION, Review of scientific instruments, 67(3), 1996, pp. 901-904
Citations number
5
Categorie Soggetti
Physics, Applied","Instument & Instrumentation
ISSN journal
00346748
Volume
67
Issue
3
Year of publication
1996
Part
2
Pages
901 - 904
Database
ISI
SICI code
0034-6748(1996)67:3<901:ISFIA>2.0.ZU;2-3
Abstract
A review of the newly developed ion sources for implantation applicati on is presented. These ion sources include Bernas ion source and elect ron cyclotron resonance (ECR) ion source. They have advantages of sour ce lifetimes and yields of multiply charged ion-beam current. Typical lifetime of Bernas source is 100 h and the ratio of As2+/As+ is about 25% with wide range beam current controllability. Lifetime of the ECR source is more than 150 h and the ratio of As2+/As+ beams is about 50% . The characteristics of these ion sources for the ion implantation sy stem are also presented on actual uses in factories. (C) 1996 American Institute of Physics.