PARTIAL SCREENING OF INTERNAL ELECTRIC-FIELDS IN STRAINED PIEZOELECTRIC QUANTUM-WELL LASERS - IMPLICATIONS FOR OPTOELECTRONIC INTEGRATION

Citation
As. Pabla et al., PARTIAL SCREENING OF INTERNAL ELECTRIC-FIELDS IN STRAINED PIEZOELECTRIC QUANTUM-WELL LASERS - IMPLICATIONS FOR OPTOELECTRONIC INTEGRATION, Applied physics letters, 68(12), 1996, pp. 1595-1597
Citations number
17
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
68
Issue
12
Year of publication
1996
Pages
1595 - 1597
Database
ISI
SICI code
0003-6951(1996)68:12<1595:PSOIEI>2.0.ZU;2-Z
Abstract
The spectral electroluminescence characteristics of broad-area (Al) Ga As/In0.23Ga0.77As/(Al)GaAs single quantum well separate confinement he terostructure lasers grown on (111)B GaAs have been studied under forw ard biased current injection. A room-temperature threshold current den sity of 750 A/cm(2) is measured for a 1000 mu m laser. The subthreshol d electroluminescence spectrum blue shifts with increasing current up to the point of lasing threshold. Our measurements reveal that lasing is achieved while there is a strong residual or ''unscreened'' electri c held across the quantum well. Based on these observations we outline how piezoelectric quantum wells can be used to monolithically integra te a quantum well laser with a blue-shifting electroabsorption modulat or. (C) 1996 American Institute of Physics.