L. Thomas et al., INITIAL-STAGES IN THE GROWTH OF CARBON-FILMS PRODUCED IN AN AR-CH4-H-2 MICROWAVE-DISCHARGE - COMPOSITION AND SURFACE-LAYERS MORPHOLOGY, Applied physics letters, 68(12), 1996, pp. 1634-1636
X-ray photoelectron spectroscopy and atomic force microscopy are emplo
yed in the characterization of the first stages in the growth of carbo
n layers on a (001) Si substrate which is not scratched with diamond p
owder before placing it in an Ar-2%CH4-H-2 plasma discharge. Results s
how that the first layers could be formed in SiC grains where the carb
on diamond particles nucleate. The high nucleation density of 1.10(9)-
5.10(9) nuclei. cm(-2) and the low aggregates density lead to a smooth
surface. (C) 1996 American Institute of Physics.