REAL-WORLD TESTING ENSURES VMEBUS RELIABILITY

Authors
WADE D DURST J
Citation
D. Wade et J. Durst, REAL-WORLD TESTING ENSURES VMEBUS RELIABILITY, Electronic design, 44(6), 1996, pp. 136
Citations number
NO
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
Electronic design → ACNP
ISSN journal
00134872
Volume
44
Issue
6
Year of publication
1996
Database
ISI
SICI code
0013-4872(1996)44:6<136:RTEVR>2.0.ZU;2-H