X-ray photoelectron spectroscopy (E-X) imaging has been applied to the
study of perfluorinated self-assembled monolayers (SAM) adsorbed on g
old surfaces. Patterned monolayers were formed using a 'stamping' proc
edure which enabled the formation of 'two-component' monolayers. The E
-X images yield spatial information, with a 30 mu m resolution, on the
quality and chemical composition of the resulting monolayer structure
s.