XPS IMAGING OF PATTERNED SELF-ASSEMBLED MONOLAYERS CONTAINING PERFLUORINATED ALKYL CHAINS

Authors
EVANS SD FLYNN TM ULMAN A BEAMSON G
Citation
Sd. Evans et al., XPS IMAGING OF PATTERNED SELF-ASSEMBLED MONOLAYERS CONTAINING PERFLUORINATED ALKYL CHAINS, Surface and interface analysis, 24(3), 1996, pp. 187
Citations number
22
Categorie Soggetti
Chemistry Physical
Journal title
Surface and interface analysis → ACNP
ISSN journal
01422421
Volume
24
Issue
3
Year of publication
1996
Database
ISI
SICI code
0142-2421(1996)24:3<187:XIOPSM>2.0.ZU;2-P
Abstract
X-ray photoelectron spectroscopy (E-X) imaging has been applied to the study of perfluorinated self-assembled monolayers (SAM) adsorbed on g old surfaces. Patterned monolayers were formed using a 'stamping' proc edure which enabled the formation of 'two-component' monolayers. The E -X images yield spatial information, with a 30 mu m resolution, on the quality and chemical composition of the resulting monolayer structure s.