CHARACTERIZATION OF INTERFACE STRUCTURES IN NANOCRYSTALLINE GERMANIUMBY MEANS OF HIGH-RESOLUTION ELECTRON-MICROSCOPY AND MOLECULAR-DYNAMICS SIMULATIONS
W. Neumann et al., CHARACTERIZATION OF INTERFACE STRUCTURES IN NANOCRYSTALLINE GERMANIUMBY MEANS OF HIGH-RESOLUTION ELECTRON-MICROSCOPY AND MOLECULAR-DYNAMICS SIMULATIONS, Zeitschrift fur Kristallographie, 211(3), 1996, pp. 147-152
The atomic structure of nanocrystalline particles formed by vapor depo
sition and subsequent annealing of amorphous thin films of germanium w
as studied by high resolution electron microscopy (HREM). The HREM ima
ges revealed a strongly varied multiply twinned structure. In some reg
ions of adjacent twins contrast features were detected which were caus
ed by an overlapping of twin lamellae. It will be shown by HREM contra
st simulations that these interface types can be described by Sigma =
3'' boundaries. The influence of lattice relaxations is taken into con
sideration by molecular dynamics simulations of the structure models.