CHARACTERIZATION OF INTERFACE STRUCTURES IN NANOCRYSTALLINE GERMANIUMBY MEANS OF HIGH-RESOLUTION ELECTRON-MICROSCOPY AND MOLECULAR-DYNAMICS SIMULATIONS

Citation
W. Neumann et al., CHARACTERIZATION OF INTERFACE STRUCTURES IN NANOCRYSTALLINE GERMANIUMBY MEANS OF HIGH-RESOLUTION ELECTRON-MICROSCOPY AND MOLECULAR-DYNAMICS SIMULATIONS, Zeitschrift fur Kristallographie, 211(3), 1996, pp. 147-152
Citations number
18
Categorie Soggetti
Crystallography
ISSN journal
00442968
Volume
211
Issue
3
Year of publication
1996
Pages
147 - 152
Database
ISI
SICI code
0044-2968(1996)211:3<147:COISIN>2.0.ZU;2-F
Abstract
The atomic structure of nanocrystalline particles formed by vapor depo sition and subsequent annealing of amorphous thin films of germanium w as studied by high resolution electron microscopy (HREM). The HREM ima ges revealed a strongly varied multiply twinned structure. In some reg ions of adjacent twins contrast features were detected which were caus ed by an overlapping of twin lamellae. It will be shown by HREM contra st simulations that these interface types can be described by Sigma = 3'' boundaries. The influence of lattice relaxations is taken into con sideration by molecular dynamics simulations of the structure models.