DEFECT DETECTION IN TEXTURED MATERIALS BY OPTICAL FILTERING WITH STRUCTURED DETECTORS AND SELF-ADAPTABLE MASKS

Authors
CIAMBERLINI C FRANCINI F LONGOBARDI G SANSONI P
Citation
C. Ciamberlini et al., DEFECT DETECTION IN TEXTURED MATERIALS BY OPTICAL FILTERING WITH STRUCTURED DETECTORS AND SELF-ADAPTABLE MASKS, Optical engineering, 35(3), 1996, pp. 838-844
Citations number
10
Categorie Soggetti
Optics
Journal title
Optical engineering → ACNP
ISSN journal
00913286
Volume
35
Issue
3
Year of publication
1996
Pages
838 - 844
Database
ISI
SICI code
0091-3286(1996)35:3<838:DDITMB>2.0.ZU;2-#
Abstract
An optical method using Fourier transformation and spatial filtering i s used to reveal defects in textured materials in real time. New optic al structured filter types were developed including a self-adaptable m ask made of photochromic polymers. The characteristics of these materi als make possible very promising applications in pattern recognition s uch as that represented by a fabric. (C) 1996 Society of Photo-Optical Instrumentation Engineers.