QUASI-PARTICLE LIFETIMES AND TUNNEL TIMES IN SIS JUNCTIONS FOR X-RAY SPECTROSCOPY

Authors
LUITEN OJ VANLIESHOUT HL MICHELS FA VALKO P BRUIJN MP KIEWIET F DEKORTE PAJ ADELERHOF DJ HAMSTER AW BRONS CGS FLOKSTRA J
Citation
Oj. Luiten et al., QUASI-PARTICLE LIFETIMES AND TUNNEL TIMES IN SIS JUNCTIONS FOR X-RAY SPECTROSCOPY, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 370(1), 1996, pp. 72-74
Citations number
7
Categorie Soggetti
Nuclear Sciences & Tecnology","Physics, Particles & Fields","Instument & Instrumentation",Spectroscopy
Journal title
Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment → ACNP
ISSN journal
01689002
Volume
370
Issue
1
Year of publication
1996
Pages
72 - 74
Database
ISI
SICI code
0168-9002(1996)370:1<72:QLATTI>2.0.ZU;2-3
Abstract
The quasiparticle lifetimes and tunneltimes in SIS tunnel junctions ar e essential parameters in the development of these devices for high re solution X-ray spectroscopy. We present a simple analytical model whic h allows us to calculate both the risetime and the total charge of the integrated tunnel current following an X-ray event. Simultaneous meas urement of both the total charge and the risetime thus becomes a usefu l diagnostic tool for quantitative analysis. We have applied the model to recent X-ray measurements on a Nb/AlOx SIS junction. We find that the energy resolution achieved in this device is mainly limited by var iations in the thickness of the counter electrode.