SURFACE-MORPHOLOGY OF POLYCRYSTALLINE DIAMOND FILMS ETCHED BY AR+ BEAM BOMBARDMENT

Citation
H. Saitoh et al., SURFACE-MORPHOLOGY OF POLYCRYSTALLINE DIAMOND FILMS ETCHED BY AR+ BEAM BOMBARDMENT, Journal of Materials Science, 31(3), 1996, pp. 603-606
Citations number
11
Categorie Soggetti
Material Science
ISSN journal
00222461
Volume
31
Issue
3
Year of publication
1996
Pages
603 - 606
Database
ISI
SICI code
0022-2461(1996)31:3<603:SOPDFE>2.0.ZU;2-Q
Abstract
Polycrystalline diamond films etched by Ar+ beam bombardment were inve stigated by scanning electron microscopy and Raman spectroscopy. In an ion sputtering apparatus, an etching rate of 14 mu m C-1 was obtained when 10 kV-accelerated Ar+ ions penetrated with an angle of 15-30 deg rees from the normal. A number of cavities were created on the surface treated at low incidence angle. In contrast, micro-prominence was see n under the condition of high incidence angle. The degree of surface r oughness on etched films was also changed with the incidence angle of the beam. A relatively smooth surface appeared after the treatment wit h an incidence angle of greater than or equal to 15 degrees. Raman spe ctroscopy revealed that the physical etching of diamond is effective i n obtaining high quality surface of polycrystalline diamond films.