H. Saitoh et al., SURFACE-MORPHOLOGY OF POLYCRYSTALLINE DIAMOND FILMS ETCHED BY AR+ BEAM BOMBARDMENT, Journal of Materials Science, 31(3), 1996, pp. 603-606
Polycrystalline diamond films etched by Ar+ beam bombardment were inve
stigated by scanning electron microscopy and Raman spectroscopy. In an
ion sputtering apparatus, an etching rate of 14 mu m C-1 was obtained
when 10 kV-accelerated Ar+ ions penetrated with an angle of 15-30 deg
rees from the normal. A number of cavities were created on the surface
treated at low incidence angle. In contrast, micro-prominence was see
n under the condition of high incidence angle. The degree of surface r
oughness on etched films was also changed with the incidence angle of
the beam. A relatively smooth surface appeared after the treatment wit
h an incidence angle of greater than or equal to 15 degrees. Raman spe
ctroscopy revealed that the physical etching of diamond is effective i
n obtaining high quality surface of polycrystalline diamond films.