A STUDY OF THE NONLINEAR ABSORPTION OF GE NANOCRYSTALLITES EMBEDDED IN SIO2 THIN-FILMS BY THE Z-SCAN TECHNIQUE

Authors
YUE LP HE YZ
Citation
Lp. Yue et Yz. He, A STUDY OF THE NONLINEAR ABSORPTION OF GE NANOCRYSTALLITES EMBEDDED IN SIO2 THIN-FILMS BY THE Z-SCAN TECHNIQUE, Journal of materials science letters, 15(3), 1996, pp. 263-265
Citations number
11
Categorie Soggetti
Material Science
Journal title
Journal of materials science letters → ACNP
ISSN journal
02618028
Volume
15
Issue
3
Year of publication
1996
Pages
263 - 265
Database
ISI
SICI code
0261-8028(1996)15:3<263:ASOTNA>2.0.ZU;2-Z