FEMTOSECOND OPTICAL SPECTROSCOPY AND SCANNING PROBE MICROSCOPY

A new technique and an apparatus which provide a promising approach fo r simultaneous spatial and temporal resolution of optically initiated dynamics at interfaces are presented. The method, based on the integra tion of femtosecond optical spectroscopy and scanning probe microscopy (FOS-SPM), is shown to be capable of spatially localizing optical mea surements at an interface via. coupling of the optical field to a meta l SPM tip. FOS-SPM measurements are shown to obtain femtosecond time r esolution in optically induced processes via an optical pump-probe cor relation method. The ability of FOS-SPM to identify and differentiate between different optoelectronic mechanisms is demonstrated. The poten tially broad applicability of the technique for the study of interfaci al and adsorbate dynamics of numerous systems with simultaneous high s patial and temporal resolution is discussed.