ELLIPSOMETRIC INVESTIGATIONS AND LUMINESCENCE PROPERTIES OF SEMICONDUCTOR MICROCAVITIES

Citation
G. Jungk et al., ELLIPSOMETRIC INVESTIGATIONS AND LUMINESCENCE PROPERTIES OF SEMICONDUCTOR MICROCAVITIES, Nuovo cimento della Societa italiana di fisica. D, Condensed matter,atomic, molecular and chemical physics, biophysics, 17(11-12), 1995, pp. 1519-1526
Citations number
8
Categorie Soggetti
Physics
ISSN journal
03926737
Volume
17
Issue
11-12
Year of publication
1995
Pages
1519 - 1526
Database
ISI
SICI code
0392-6737(1995)17:11-12<1519:EIALPO>2.0.ZU;2-I
Abstract
Luminescence investigations on MBE-grown AlAs/AlGaAs microcavities rev eal position-dependent spectra from embedded GaAs quantum wells and fr om the reflector material. Because of their uniform energetic shifts t hey should be connected with the spatial distribution of strain. The s pectra themselves are related to the radiative recombination of confin ement shifted free-electron-hole pairs, free and bound excitons and to the intrinsic luminescence of AlGaAs. Ellipsometric investigations in the range of the resonator stop band around 1.5 eV accentuate the one -dimensional behaviour as a 1D singularity within the effective joint density of states. The resonator mode and the stop band are dependent on the angle of incidence. The effective dielectric function is metal- like with the maximum imaginary part above 10(3), i.e. as it is typica l for a pure metal in the FIR. Analogous investigations between 2.5 an d 3.5 eV determined the critical points E(0) and E(1) of the energy ba nd structure of AlAs and AlGaAs, respectively.