RELATIONSHIP BETWEEN DIFFERENT RESISTANCE PARAMETERS IN FRENCH BEAN TO FLOURY LEAF-SPOT CAUSED BY MYCOVELLOSIELLA-PHASEOLI (DRUMMOND) DEIGHTON

Citation
Kd. Sharma et al., RELATIONSHIP BETWEEN DIFFERENT RESISTANCE PARAMETERS IN FRENCH BEAN TO FLOURY LEAF-SPOT CAUSED BY MYCOVELLOSIELLA-PHASEOLI (DRUMMOND) DEIGHTON, Crop protection, 15(1), 1996, pp. 101-103
Citations number
6
Categorie Soggetti
Agriculture
Journal title
ISSN journal
02612194
Volume
15
Issue
1
Year of publication
1996
Pages
101 - 103
Database
ISI
SICI code
0261-2194(1996)15:1<101:RBDRPI>2.0.ZU;2-9
Abstract
Eighty-nine germplasm lines of french bean (Phaseolus vulgaris) consis ting of local and exotic collections were tested for components of res istance including lesion number, lesion size and halo size in 2 years. The parameters lesion size and 'halo' size were strongly correlated. Lesions were always larger than halos; however, accession EC 285577 de signated as highly susceptible on the basis of number of lesions, had restricted lesions with exceptionally large halos. Only EC 285550 and EC 285556 were resistant to floury leaf spot, and EC 285549 and EC 285 572 were moderately resistant. The disease appeared late in resistant as well as in moderately resistant lines in comparison to the highly s usceptible line EC 285578.