MICROCRYSTALLOGRAPHY USING ATOMIC-FORCE MICROSCOPY

Authors
HELBIG HF BEASOCK JV RAMSEYER GO WALSH LH
Citation
Hf. Helbig et al., MICROCRYSTALLOGRAPHY USING ATOMIC-FORCE MICROSCOPY, Applied physics letters, 68(13), 1996, pp. 1778-1780
Citations number
7
Categorie Soggetti
Physics, Applied
Journal title
Applied physics letters → ACNP
ISSN journal
00036951
Volume
68
Issue
13
Year of publication
1996
Pages
1778 - 1780
Database
ISI
SICI code
0003-6951(1996)68:13<1778:MUAM>2.0.ZU;2-Q
Abstract
Scanning microscopy can be used to obtain crystallographic information about suboptical structures. By the same token, the x-y-z length scal es of scanning microscopy can be brought into mutual consistency by me asuring the angles between facets of crystallites of known habit. (C) 1996 American Institute of Physics.