STUDY OF THE LEAKAGE FIELD OF MAGNETIC FORCE MICROSCOPY THIN-FILM TIPS USING ELECTRON HOLOGRAPHY

Citation
Bg. Frost et al., STUDY OF THE LEAKAGE FIELD OF MAGNETIC FORCE MICROSCOPY THIN-FILM TIPS USING ELECTRON HOLOGRAPHY, Applied physics letters, 68(13), 1996, pp. 1865-1867
Citations number
7
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
68
Issue
13
Year of publication
1996
Pages
1865 - 1867
Database
ISI
SICI code
0003-6951(1996)68:13<1865:SOTLFO>2.0.ZU;2-E
Abstract
Electron holography is applied for the study of the leakage field of t hin-film ferromagnetic tips used as probes in magnetic force microscop y. We used commercially available pyramidal tips covered on one face w ith a thin NiCo film, which were then placed in a high external magnet ic field directed along the pyramid axis. Good agreement between simul ated and experimental electron phase difference maps allows to measure the local flux from the ferromagnetic tips and therefore to evaluate the perturbation induced by the microprobe stray field on the sample a rea. (C) 1996 American Institute of Physics.