SCANNING MICROSCOPY THROUGH THICK LAYERS BASED ON LINEAR CORRELATION

Authors
KEMPE M RUDOLPH W
Citation
M. Kempe et W. Rudolph, SCANNING MICROSCOPY THROUGH THICK LAYERS BASED ON LINEAR CORRELATION, Optics letters, 19(23), 1994, pp. 1919-1921
Citations number
20
Categorie Soggetti
Optics
Journal title
Optics letters → ACNP
ISSN journal
01469592
Volume
19
Issue
23
Year of publication
1994
Pages
1919 - 1921
Database
ISI
SICI code
0146-9592(1994)19:23<1919:SMTTLB>2.0.ZU;2-O
Abstract
Scanning microscopy in combination with an interferometric correlation technique that uses short light pulses or broadband cw light is shown to permit enhanced depth discrimination, which is particularly useful for imaging through thick layers introducing spherical aberration and through scattering media.