L. Pelaz et al., SATURATION OF GENERATION-RECOMBINATION CURRENT FOR VERY SMALL RECOMBINATION TIMES, Journal of applied physics, 76(11), 1994, pp. 7384-7389
Analysis of the generation-recombination processes by numerical simula
tion allows consideration of a very small recombination time constant
in order to study the behavior of p-n junctions in this extreme situat
ion. The generation-recombination current does not increase indefinite
ly as the generation or recombination mechanism is more and more; acti
ve. Instead, current saturation occurs as a result of the continuity e
quation along with the generation-recombination expression. This gener
ation-recombination current saturation takes place in any semiconducto
r and establishes the maximum current limit that can be yielded by thi
s mechanism. (C) 1994 American Institute of Physics.