SATURATION OF GENERATION-RECOMBINATION CURRENT FOR VERY SMALL RECOMBINATION TIMES

Citation
L. Pelaz et al., SATURATION OF GENERATION-RECOMBINATION CURRENT FOR VERY SMALL RECOMBINATION TIMES, Journal of applied physics, 76(11), 1994, pp. 7384-7389
Citations number
13
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
76
Issue
11
Year of publication
1994
Pages
7384 - 7389
Database
ISI
SICI code
0021-8979(1994)76:11<7384:SOGCFV>2.0.ZU;2-A
Abstract
Analysis of the generation-recombination processes by numerical simula tion allows consideration of a very small recombination time constant in order to study the behavior of p-n junctions in this extreme situat ion. The generation-recombination current does not increase indefinite ly as the generation or recombination mechanism is more and more; acti ve. Instead, current saturation occurs as a result of the continuity e quation along with the generation-recombination expression. This gener ation-recombination current saturation takes place in any semiconducto r and establishes the maximum current limit that can be yielded by thi s mechanism. (C) 1994 American Institute of Physics.