HYDROGEN PASSIVATION EFFECTS IN INGAALP AND INGAP

Citation
Va. Gorbylev et al., HYDROGEN PASSIVATION EFFECTS IN INGAALP AND INGAP, Journal of applied physics, 76(11), 1994, pp. 7390-7398
Citations number
15
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
76
Issue
11
Year of publication
1994
Pages
7390 - 7398
Database
ISI
SICI code
0021-8979(1994)76:11<7390:HPEIIA>2.0.ZU;2-Q
Abstract
The effects of hydrogen treatment on electrical properties, luminescen ce spectra, and deep traps in InGaAlP and InGaP have been studied. It is shown that acceptors and donors (both shallow and deep) can be effe ctively passivated by hydrogen. The hydrogen is found not only to pass ivate the main electron and hole traps in our samples, but also to gen erate electron traps in n-InGaAlP and hole traps in p-InGaP. The influ ence of hydrogen treatment mode (direct plasma or a crossed-beams sour ce in which the low-energy ion bombardment of the surface is effective ly eliminated) on hydrogen concentration and hydrogen profiles in InGa AlP are discussed. (C) 1994 American Institute of Physics.