Hg. Boyen et al., LOW-TEMPERATURE AMORPHIZATION AT INTERFACES IN LAYERED STRUCTURES - EVIDENCE FOR A LOW-DIMENSIONAL PEIERLS SYSTEM, Journal of non-crystalline solids, 207, 1996, pp. 776-780
Interface reactions were observed by means of photoelectron spectrosco
py during the preparation of Au/Sn bilayers at 77 K. These reactions l
ead to ultra-thin (0.5-2 nm) amorphous layers with tunable stoichiomet
ry, spanning the same range of compositions as found for the correspon
ding vapor-quenched amorphous Hume-Rothery alloys. in all cases, struc
ture-induced minima in the electronic density of states at the Fermi l
evel are observed for the intermixed amorphous phases. Since structure
-induced minima are a characteristic feature of a Peierls system, the
ultra-thin amorphous layers may be discussed as reflecting the transit
ion from a nearly two-dimensional to an isotropic three-dimensional Pe
ierls-distorted system.