A new layered compound within the nominal composition range of Y2SrCo2
-xCu(x)O6.5(0.5<x<0.7) was isolated. By indexing its X-ray diffraction
patterns, we obtained cell parameters of a = 5.423angstrom, b = 10.71
7angstrom, c = 19.968angstrom for the single phase sample(x=0.6). From
the cell parameters and the XRD peak intensities, it was found that t
he title compound is isostructural with Y2SrCuFeO6.5. The as-prepared
samples were semiconductive and showed ferromagnetic behavior with a C
urie temperature(Tc) of 382K.