DESIGN OF CMOS SELF-CHECKING SEQUENTIAL-CIRCUITS WITH IMPROVED DETECTABILITY OF BRIDGING FAULTS

Citation
C. Metra et al., DESIGN OF CMOS SELF-CHECKING SEQUENTIAL-CIRCUITS WITH IMPROVED DETECTABILITY OF BRIDGING FAULTS, Electronics Letters, 30(23), 1994, pp. 1934-1936
Citations number
7
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
ISSN journal
00135194
Volume
30
Issue
23
Year of publication
1994
Pages
1934 - 1936
Database
ISI
SICI code
0013-5194(1994)30:23<1934:DOCSSW>2.0.ZU;2-E
Abstract
Problems due to the presence of resistive bridging faults within seque ntial functional blocks of self-checking circuits are studied, and des ign criteria aimed at reducing their effects are proposed.