C. Metra et al., DESIGN OF CMOS SELF-CHECKING SEQUENTIAL-CIRCUITS WITH IMPROVED DETECTABILITY OF BRIDGING FAULTS, Electronics Letters, 30(23), 1994, pp. 1934-1936
Problems due to the presence of resistive bridging faults within seque
ntial functional blocks of self-checking circuits are studied, and des
ign criteria aimed at reducing their effects are proposed.