ARRAYS TO ATOMS - THE RANGE, EVOLUTION, AND FRONTIERS OF CHARACTERIZATION

Characterization is one important component in the ensemble of photovo ltaics research and development efforts. It has supported the evolutio n of the technology, and measurement techniques have themselves evolve d in response to the technology's needs. This paper highlights some im portant evaluation and verification techniques, covering macroscale th rough nanooscale characterization methods. Some emphasis is placed upo n the lower spatial resolution regimes, in which the characterization and processing of semiconductors are leading to areas of atomic engine ering of materials.