OPTICAL AND STRUCTURAL-PROPERTIES OF SPUTTERED CDTE THIN-FILMS

Citation
H. Mohssine et al., OPTICAL AND STRUCTURAL-PROPERTIES OF SPUTTERED CDTE THIN-FILMS, Renewable energy, 5(1-4), 1994, pp. 205-208
Citations number
8
Categorie Soggetti
Energy & Fuels
Journal title
ISSN journal
09601481
Volume
5
Issue
1-4
Year of publication
1994
Pages
205 - 208
Database
ISI
SICI code
0960-1481(1994)5:1-4<205:OASOSC>2.0.ZU;2-0
Abstract
The structural and optical properties of polycrystalline CdTe thin fil ms are investigated. The films were grown by the standard rf sputterin g technique using high purity (5N) CdTe target. X-ray diffraction stud ies are performed in order to determine structure and texture of sampl es. It is found that the as grown films show a mixture between hexagon al and cubic phases. It should be noted that the preferential directio n of crystallites changes with changing deposition parameters. Optical properties of sputtered films are obtained from transmission measurem ents in the energy range 0.5-2.5 eV. The results confirm the direct ch aracter of the interband transition and the optical constants show a c lear variations with deposition parameters and annealing.