OPTICAL AND STRUCTURAL-PROPERTIES OF SPUTTERED CDTE THIN-FILMS

The structural and optical properties of polycrystalline CdTe thin fil ms are investigated. The films were grown by the standard rf sputterin g technique using high purity (5N) CdTe target. X-ray diffraction stud ies are performed in order to determine structure and texture of sampl es. It is found that the as grown films show a mixture between hexagon al and cubic phases. It should be noted that the preferential directio n of crystallites changes with changing deposition parameters. Optical properties of sputtered films are obtained from transmission measurem ents in the energy range 0.5-2.5 eV. The results confirm the direct ch aracter of the interband transition and the optical constants show a c lear variations with deposition parameters and annealing.