MODELING THE THERMAL EFFECTS THAT ACCOMPANY THE TESTING OF OPTOELECTRONIC DEVICES IN VACUUM

Authors
MARTYNOV DA
Citation
Da. Martynov, MODELING THE THERMAL EFFECTS THAT ACCOMPANY THE TESTING OF OPTOELECTRONIC DEVICES IN VACUUM, Journal of optical technology, 61(11), 1994, pp. 785-788
Citations number
NO
Categorie Soggetti
Optics
Journal title
Journal of optical technology → ACNP
ISSN journal
10709762
Volume
61
Issue
11
Year of publication
1994
Pages
785 - 788
Database
ISI
SICI code
1070-9762(1994)61:11<785:MTTETA>2.0.ZU;2-1
Abstract
This paper discusses the requirements imposed on test stands that simu late thermal effects on optoelectronic devices in vacuum. The requirem ents on the automatic control systems of single-channel and multichann el thermal-effect simulators are presented, along with a system for co llecting and processing temperature-field data.