OPTICAL NEAR-FIELD LITHOGRAPHY ON HYDROGEN-PASSIVATED SILICON SURFACES

Citation
S. Madsen et al., OPTICAL NEAR-FIELD LITHOGRAPHY ON HYDROGEN-PASSIVATED SILICON SURFACES, Applied physics letters, 69(4), 1996, pp. 544-546
Citations number
25
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
69
Issue
4
Year of publication
1996
Pages
544 - 546
Database
ISI
SICI code
0003-6951(1996)69:4<544:ONLOHS>2.0.ZU;2-Q
Abstract
We report on a novel lithography technique for patterning of hydrogen- passivated amorphous silicon surfaces. A reflection mode scanning near -field optical microscope with uncoated fiber probes has been used to locally oxidize a thin amorphous silicon layer. Lines of 110 nm in wid th, induced by the optical near field, were observed after etching in potassium hydroxide. The uncoated fibers can also induce oxidation wit hout light exposure, in a manner similar to an atomic force microscope , and linewidths of 50 nm have been achieved this way. (C) 1996 Americ an Institute of Physics.