We report on a novel lithography technique for patterning of hydrogen-
passivated amorphous silicon surfaces. A reflection mode scanning near
-field optical microscope with uncoated fiber probes has been used to
locally oxidize a thin amorphous silicon layer. Lines of 110 nm in wid
th, induced by the optical near field, were observed after etching in
potassium hydroxide. The uncoated fibers can also induce oxidation wit
hout light exposure, in a manner similar to an atomic force microscope
, and linewidths of 50 nm have been achieved this way. (C) 1996 Americ
an Institute of Physics.