Ra. Zubarev et al., KINETIC ENERGIES OF SECONDARY IONS IN MEV AND KEV PARTICLE-INDUCED DESORPTION, Rapid communications in mass spectrometry, 10(15), 1996, pp. 1966-1974
Kinetic energy distributions of secondary ions produced by MeV or keV
primary-ion bombardment of molecular solids sere measured in a reflect
ron time-of-flight mass spectrometer. It was found that the energy dis
tributions of many ions exhibit tails extending towards energies lower
than the accelerating potential. The degree of tailing depends upon t
he nature of the desorbed ion and the conditions of the target surface
. Some light ions (H+ and C+), ions from inorganic (alkali halide) sam
ples, radical molecular ions (C-60(+.)) and pre-formed molecular ions
(e.g. complexes of valinomycin with alkali metal ions) exhibit almost
no tailing. For positive adduct-type molecular ions, such as MH(+), mo
re extensive tailing was observed far MeV compared with keV primary io
ns. The origin of the energy tailing is attributed to gas-phase format
ion of a fraction of the secondary ions. For molecular ions of peptide
s, the characteristic time of formation of that fraction of ions (appr
oximate to 10% of the whole molecular-ion population) was estimated to
be of the order of 10 ns, while the characteristic distance from the
target surface was of the order of 10 mu m.