N-14(-16(+), AND NE-20(+) ION-BEAMS FOR STUDIES OF CHARGE-INDUCED X-RAY YIELDS(), O)

Previously reported work on abnormal PIXE yields with low energy ions was confirmed with low energy (600-1500 keV) N-14(+), O-16(+) and Ne-2 0(+) ions whose X-ray production cross sections are negligibly small f or PIXE yields. Abnormally intense X-ray yields were recorded from the metal components of homogeneous thick targets of binary metal fluorid es thus verifying the hypothesis that these yields originate from a di scharge of high potential resulting from a charge build-up on the samp le with the production of a flux of energetic electrons.